Sentence examples for scanning electrical microscopy from inspiring English sources

To understand the mechanisms of conductivity and piezoresistance at the micro-scale, micro-characterization utilizing Scanning Electrical Microscopy (SEM) equipped with Energy Dispersive Spectrometer (EDS) technique is performed to examine the mortar microstructure containing GNPs.

Transmission electrical microscopy (TEM) and scanning electrical microscopy (SEM) showed that the particle size of TiO2 decreased and the microstructure of the film became loose with the addition of HPC, reaching an optimum when the concentration of HPC was 4.5×10−3 g/g sol.

The laser-irradiated samples were then characterized by scanning electrical microscopy (SEM), transmission electron microscopy (TEM), and energy-dispersive X-ray (EDX) analyses.

The IFSS of the fiber composites were evaluated through microdroplet testing, and the corresponding failure mechanism was examined using scanning electrical microscopy.

These samples were analyzed using X- ray diffraction, optical absorption spectroscopy, energy dispersive X-ray analysis, scanning electron microscopy, and electrical measurements in order to investigate the role of pH of the precursor solution on structural, morphological, electrical and optical properties of the SnS films.

After chemical mechanical polishing the structures were characterized by scanning electron microscopy and electrical measurements.

Characterization of the complexes by powder X-ray diffraction, scanning electron microscopy and electrical conductivity is presented.

The samples were characterized by the following experimental techniques: thermogravimetric analysis/differential thermal analysis (TGA/DTA), compressive strength tests, determination of the chloride migration coefficient, scanning electron microscopy (SEM), electrical resistivity measurement and mercury intrusion porosimetry (MIP).

Scanning probe microscopy (SPM -based electrical meaSPM -basedrelectricalselves as powerful techniques for electrical characterizations at nanoscale [20, 21].

Furthermore, in order to minimize any damage or contamination of the SWNT before electrical properties measurements, scanning electron microscopy (SEM), Raman spectroscopy mapping, and atomic force microscopy (AFM) are performed only after all the electrical transport measurements are achieved.

Further, the results are analyzed and compared based on their electrical conductivity measurement, scanning electron microscopy (SEM), and energy dispersive X-ray spectroscopy (EDS).