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Scanning Electrical Microscope (SEM) analysis indicated that rupture initiates at the notch root in the notched specimen and at the inner in the smooth specimen.
After gridding, the fine waste materials were characterized by the determination of density, Blaine fineness and particle morphology using scanning electrical microscope.
Microstructural observation was carried out by a scanning electrical microscope (JEOL SM-67F, operated at 10 kV).
High-resolution scanning electrical microscope (HR-SEM) and optical microscope (OM) were used to observe the thicknesses of the Al2O3 films and the distribution of blisters, respectively.
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These films were characterized by X-ray diffraction (XRD), scanning electron microscope (SEM) and electrical measurement systems.
In another case [15], one side of the nanowire was fixed to a stage connected to negative electrode while another side was aligned to positive electrode by means of scanning electron microscope (SEM), forming an electrical device for scientific research.
The films were characterized by X-ray diffraction (XRD), scanning electron microscope (SEM), X-ray photoelectron spectroscopy, electrical resistivity, and Vickers micro-hardness.
Multi-walled carbon nanotubes (MWNTs) were electrochemically oxidized by a constant-potential electrolysis method and then investigated in detail using scanning electron microscope, transmission electron microscope, FT-IR, electrical impedance spectroscopy, and cyclic voltammetry.
Crystal structure and electrical properties of La10Si6 xNbxO27+δ ceramics are investigated by X-ray diffraction, scanning electron microscope, transmission electron microscope, Raman spectroscopy and complex impedance measurements.
Four point probe tester, Scanning Electron Microscope, Energy Dispersive Spectrum and pin on-disc system were used to evaluate electrical conductivity, characterization and tribological property of Cu–W composite respectively.
The effects of substrate and hydrogen plasma treatment on the microstructure and electrical conductivity were examined in detail using X-ray diffraction (XRD), scanning electron microscope (SEM), transmission electron microscope (TEM), and the Hall Effect measurement.
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