Sentence examples for scanning capacitance microscopy from inspiring English sources
scanning capacitance microscopy.
The nanoscale electrical properties of single-layer graphene (SLG), bilayer graphene (BLG) and multilayer graphene (MLG) are studied by scanning capacitance microscopy (SCM) and electrostatic force microscopy (EFM).
Scanning capacitance microscopy and spectroscopy were used to study the memory properties and charge effect in the Si nanocrystal in ambient temperature.
In this letter, scanning capacitance microscopy and spectroscopy (SCS) were used to study the memory properties and charge effect of the Si-ncs materials in ambient temperature.
Scanning capacitance microscopy is an analytical technique able to provide direct carrier distribution information on the nanoscale using HF amplitude detection and lock-in techniques.
It can provide simultaneous topography and various physical feature images with some additional electrical applications such as scanning capacitance microscopy (SCM) [6, 7], electrostatic force microscopy (EFM) [8], scanning resistance microscopy [9] and Kelvin probe force microscopy [10].
Holes or electrons can be separately injected into these Si-ncs and the capacitance changes caused by these trapped charges can be easily detected by scanning capacitance microscopy/spectroscopy at the nanometer scale.
scanning capacitance spectroscopy.
Conductive AFM and scanning probe capacitance microscopy (SCM) were measured in contact-mode using a Pt-coated Si tip and a diamond-coated Si tip, respectively.
Scanning probe capacitance microscopy (SCM) was applied to measure the local electrical characteristics; however, the isolated quantum dots could not be resolved due to the large concentration of Fe-related defects.
scanning probe capacitance microscopy.
