Sentence examples for scanning axis from inspiring English sources

In a typical matrix-based SPM image, drift is mainly seen in the slow scanning axis, leading to image distortion as seen in Figure 6B.

A 5-μm-long atomic image of a highly oriented pyrolytic graphite (HOPG) crystal along the fast scanning axis was obtained using the DTU STM in the temperature control cell.

To ensure that the fixed point can measured by the sensor, an algorithm for determining the position of the CMM scanning axis where the laser plane passes through the fixed point is put forward.

The B f-scans from the dataset with the vertical fast scanning axis can now be used to correct the artifacts in the B s-scans of the dataset with the horizontal fast scanning axis.

Furthermore, these distortions differ along the slow scanning axis (B s-scans or yz slices) and the fast scanning axis (B f-scans or xz slices), as depicted in Figs. 1(b) and 1(c).

The biological tissue specimen is located on a computer-controlled motorized stage allowing displacements along the scanning axis x and the focusing axis z.

Only fibrils that were perpendicular to the scan axis were used.

Double serpentine scans (i.e., performing a second scan after rotating the slow-scan axis by 90°) can also be implemented.

Simultaneous motion of the slow-scan resonant movement along with the modulation of 1D LED array in perpendicular direction to the slow-scan axis enables the generation virtual pixels on a 2D image plane.

Commonly, the scans do not overlap due to scanner hysteresis (i.e. features observed in forward and backward scans do not correspond to the same pixel position in the fast-scan axis), so the code includes a "matching" subroutine (based on lateral deflection image cross-correlation) that automatically overlaps both scans before calculating the friction.

In this method, the diameters of particles along each of the horizontal scan lines (or the "fast scan axis", as called in the NanoScope AFM) are measured.