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(a) Optical image of the scanned area.
A brightfield image of the scanned area is shown in Fig. 5(a).
The roughness parameters and roughness distribution of the scanned area were also determined.
The electron beam also plays an important role in the growth by accumulating hydrocarbon gas at the scanned area; there is no growth in areas far from the scanned area as shown in Supplementary Fig. 7.
The images for gene expression profiling in the entire scanned area were generated by using a 20 × objective.
For the SPM application, as an additional requirement, a very low surface roughness of the scanned area becomes imperative.
This analytical approach provides a large sampling with the identification of > 10,000 particles over the scanned area.
With the GIS software (ArcGIS), we got a scanning map that showed the distribution of NDVI values in the scanned area.
In this way it is possible to map impedance of the scanned area along with other surface features available via classical AFM measurements such as height profile.
Elastic modulus assessment based on the ultrasonic Lamb wave pitch catch method is used and the surface condition of the scanned area is investigated by a microscope.
The scanned area is 4 × 4 μm2.
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