Sentence examples for scan test from inspiring English sources

Test 3 is at 28 weeks (after first treatment response scan), test 4 is at 40 weeks (after second treatment response scan) and the final test (test 5) is at 52 weeks.

Low Automatic Test Pattern Generation (ATPG) scan chain yield was reported during final scan test.

Each scan test pattern is considered by its transition and segmented into equal necessary blocks.

In this paper, we present two multistage compression techniques to reduce the test data volume in scan test applications.

In disjoint-window scan test, the MA travels across the sensor network and scans the network using no overlapping windows.

As mentioned in the introduction, state DOT's are using different methods for the assessment of IR scan test results of concrete admixtures from job sites.

A new tri-state holding logic is presented to replace the common holding latch in enhanced-scan test to get a substantial low hardware overhead.

Existing techniques for delay test such as skewed-load or broadside make the test generation process complex and produce lower coverage for scan-based designs as compared with non-scan designs, whereas techniques such as enhanced-scan test can make the test easy but need an extra holding latch to add substantial hardware overhead.

Rates of negative sentences formed during scanning and in the pre-scan test were highly correlated across subjects (Spearman's rank correlation r = 0.48, p<0.001).

The post-scan test however yielded different results.

Our post-scan test was applied immediately after the scan.