Sentence examples for scan electronic microscope from inspiring English sources
The morphologies of the hierarchical structured Cu/Ni Co were characterized by field emitting scan electronic microscope (FE-SEM, FEI SIRION200) and transmission electron microscope (TEM, JEM 2100F).
A mold is designed to obtain a controllable self-assembly method, colloidal crystals are observed by scan electronic microscope (SEM) and the band-gap is measured by infrared spectrometer.
Scan Electronic Microscope (SEM) analysis showed that both macrohairs and microhairs on the abaxial and adaxial sides of NIL GLR1 leaves are able to be observed (Figure 1d and Figure 1e).
The microhardness of titanium oxide films prepared at different experimental conditions is maintained between 900 and 1000 kg/mm2, when measured by UMHT-3 ultramicrohardness tester installed in the scan electronic microscope.
In the paper, the strength variations of CAM exposed to water was investigated at various water temperatures (20 °C, 40 °C and 60 °C) and pressures (0.0 MPa, 0.1 MPa, 0.2 MPa, 0.3 MPa, 0.4 MPa and 0.5 MPa) and the microstructure evolution was analyzed by mercury intrusion porosimetry (MIP) and scan electronic microscope (SEM).
The prepared BiOI and BiOI-based photoanodes were characterized by X-ray diffraction (XRD), scanning electronic microscope (SEM), transmission electron microscopy (TEM), X-ray photoelectron spectroscopy (XPS), and UV vis diffuse reflectance spectroscopy (DRS) to examine the surface structure and the properties of light absorption.
The surface morphology, shell thickness and core shell structure of TC-MPCMs were characterized via optical microscope (OM), thermal field emission scanning electronic microscope (TFE-SEM), transmission electron microscope (TEM), respectively.
A FEI QUANTA 600 (Hillsboro, OR, USA) environmental scanning electronic microscope (ESEM) and a JEOL JEM-1011 transmission electron microscope (TEM) with MegaView III (Soft Imaging System, Olympus, Tokyo, Japan) were used to study particle homogeneity, morphology, and size dispersion.
X-ray diffraction, scanning electronic microscope, energy-dispersive X-ray spectroscopy and transmission electron microscopy were used to identify the phase formation and morphology of the SiCw.
In a factory tour here last week, Intel used a scanning electronic microscope to display a computer chip made using the new 22-nanometer manufacturing process.
Scanning electronic microscope.
