The estimation of quantiles in two-phase sampling with arbitrary sampling design in each of the two phases is investigated.
A practical problem related to the estimation of quantiles in double sampling with arbitrary sampling designs in each of the two phases is investigated.
However, we deliberately use the crossing points of the equally weighted distribution functions as the stable and correct reference value because we think that in diagnostic practice, the composition of a test sample with arbitrary P(D) should have as little effect as possible on critical results such as the optimum cut-off threshold.
For this reason, we decided to apply one of the most common (non-parametric) significance tests known from statistics, the so-called Mann-Whitney U-test [ 48], which is widely used as statistical hypothesis test for assessing whether two independent samples of observations (with arbitrary sample sizes) come from the same distribution.
It is shown that the method can be used to calculate the polarization dependent reflectivity and the phase jumps for s and p polarization at a sample surface with arbitrary surface structure, even if the dimensions of the corrugation are close to the optical wavelength.
The proof of Eq. 23 is based on the following inequality, which compares a general multiple importance sample estimator F with arbitrary number of samples {N i } with the same estimator (i.e., using the same weights w i ) but with equal count of samples, Feq as follows: begin{array}rcl@ V[!F] ge frac{1}{n} V[!F_{{text{eq}}}].
The FIB milling provides a quick and easy way to obtain a better quality thin film sample with an arbitrary shape.
As such, it is able to determine the absolute orientation in a sample with any arbitrary pattern of either single or multiple domains.
Using this closed-form solution, we introduce a sampling rate conversion with arbitrary conversion rate, and propose a new pitch shifting method for digital sound synthesis.
We will demonstrate via simulation results the superiority of our proposed algorithms in terms of resolution, sidelobe suppression and applicability to signals with arbitrary sampling patterns.
