Sentence examples for samples of thin from inspiring English sources
Diffraction patterns of reflected high-energy electrons for samples of thin (hGe= 4 Å) Ge/Si 001) films deposited at high (650 or 600℃) and low (360℃) temperatures with equal effective thicknesses are presented in Figure4a,b.
Species richness was found to be different in 48 samples of thin phumdis, 53 samples of thick phumdis and 14 samples on hard ground.
Thin melanomas are the most difficult samples to acquire in a research setting where RNA integrity can be preserved and thus our analysis is limited by the few samples of thin melanoma we were able to collect during this study.
Some samples of thin-layer systems "organic adsorption layer on the layer of native oxide (2 nm) on iron film (200 nm) deposited on dielectric substrate (mica)" (Fig. 3a) were investigated immediately after intense pulse electron beam ionization in one vacuum chamber [2] with the aim of inducing ML and its properties investigation.
Electric field-induced nanostructuring was carried out on samples of nickel thin films coated on BSG substrates; all cut from the same piece of original thin film [37, 38].
A number of samples of SiO2 thin films were prepared using this technique.
Table 1 Formulation of sample thin films No. of samples Samples content Amount of HPC in solution (g g sol −1 ) Amount of Cu2+ (molar ratio) S1 TiO2/chitosan – – S2 TiO2/chitosan 4.5 × 10−3 – S3 TiO2/chitosan – 2 % S4 TiO2/chitosan 4.5 × 10−3 2%%.
The used samples were made of thin films electrodeposited on gold substrate.
A generous sample of the Thin White Major Tom at his most enigmatic is available at the ICA's Bowiefest, where highlights from his acting career – including The Man Who Fell To Earth, Labyrinth and Absolute Beginners – will be accompanied by DJ sets and Q&As featuring Jeremy Deller and former drummer Woody Woodmansey.
Figure 3 illustrates the optical absorption spectra for all the samples of cuprous oxide thin films deposited on Ti sheets at different applied potentials.
The crystal structure of the fabricated samples of the SnO2 thin films was performed using X-ray diffraction (XRD) analysis of PANalytical X' pert Pro MRD equipped with a Cu Kα radiation of (λ = 0.154060 nm).
