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The morphology of the sample was characterized by SEM.
The sample was characterized by SEM and XRD.
A typical sample was characterized by Scanning Electron Microscopy.
The sample was characterized by XRD, SEM and TEM.
The surface of the sample was characterized by atomic force microscope (AFM).
The sample was characterized by AFM (Digital Instruments 3000AFM) in tapping mode.
The validated sample was characterized as final varistor for this optimization process.
The magnetic saturation of the MAC sample was characterized using vibrating sample magnetometer (VSM).
The morphology of the fabricated sample was characterized by FESEM technique (Figure 2a).
The Raman spectrum of the sample was characterized by Raman spectroscopy (LabRAM HR800).
The sample was characterized by the X-ray DRON-4 diffractometer using CoКα radiation.
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