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Sampling connection system means an assembly of equipment within a process unit used during periods of representative operation to take samples of the process fluid.
Equipment, for purposes of § 63.1363, means each pump, compressor, agitator, pressure relief device, sampling connection system, open-ended valve or line, valve, connector, and instrumentation system in organic hazardous air pollutant service.
Equipment means each pump, compressor, agitator, pressure relief device, sampling connection system, open-ended valve or line, valve, connector, and instrumentation system in regulated material service; and any control devices or systems used to comply with this subpart.
A chemical manufacturing process unit includes pumps, compressors, agitators, pressure relief devices, sampling connection systems, open-ended valves or lines, valves, connectors, instrumentation systems, and control devices or systems.
The validated model, subjected to fluctuating wind loads obtained from design storms of different durations along with the stochastically sampled connection parameters established from experiments, was used to estimate the probability of roof failures of a gable roof building.
Equipment leak means emissions of organic hazardous air pollutants from a connector, pump, compressor, agitator, pressure relief device, sampling connection system, open-ended valve or line, valve, surge control vessel, bottoms receiver, or instrumentation system in organic hazardous air pollutant service as defined in § 63.161.
A PAI process unit consists of: the process, as defined in this subpart; associated storage vessels, as determined by the procedures in § 63.1360(f); equipment identified in § 63.1362 k); connected piping and ducts; and components such as pumps, compressors, agitators, pressure relief devices, sampling connection systems, open-ended valves or lines, valves, connectors, and instrumentation systems.
These errors result from the comparisons between the desired relative or absolute delays {W k | 0 ≤ k < N} and the measured delays or the sampled connection delays {C k | 0 ≤ k < N} (output V) computed by the monitor at each sampling instant.
For electrochemical tests, samples of 8 mm in thickness were cut perpendicular to the welding direction, as depicted in Figure 1, and then mounted in resin with a copper wire attached in the back side of the sample for connection to the potentiostat.
