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The ancillary RS layers are visual and infra-red spectrum optical data from the Moderate Resolution Imaging Spectroradiometer (MODIS) sensors, elevation data from the Shuttle Radar Topography Mission (SRTM), and, in the case of RS1 only, QuikSCAT radar scatterometer data.
This is probably due to the larger proportion of non-forest vegetation in these countries, which brings down the average for the RS layers but is ignored by the FRA 2010.
From this analysis, we conclude that the RS layers underestimate AGB in the Guiana Shield due to a contribution of using mean wood density (an underestimate) and a generic pan-Amazonian relationship between diameter and height (ignoring the fact that trees are taller than would be expected for a given diameter in this region), with the two factors having approximately equal contributions.
Subtracting the two RS layers from the plot AGB values emphasizes the trends described above, with positive differences (i.e. RS1 and RS2 greater than P DH ρ) in the south and west, and negative differences in the north and east (Fig. 2d f, Table S1).
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At that time, the deposition of 'red turbidites' in the deep basin, concomitant with the deposition of the so-called 'Red Layers' onto the continental shelf and the upper slope, emphasises the direct impact of the increased meltwater runoff of the Dnieper River as far as the Danube Deep-Sea Fan.
Non-isostructural superlattices deposited at 950 °C that had (111 -oriented rs-layers and (00111 -orientedrs also exhibited little interdiffusion and, importantly, had a secondary hardness maximum near a chemical repeat period of 15 nm, rendering it the hardest superlattice for these longer chemical repeat periods.
No superlattice peaks were observed in the (100 -oriented isostructural rs-superlattices deposited at 950 °C, indicating that a significant degree of interdiffusion occurred, but the amount was orientation dependent, as (100 -oriented isostructural rs-superlatticesimilar at the two temperatures.
C01 Red layer: red pigment on aluminium phosphate substrate.
Hence, x, y, z represent row (R), layer (L), and column number (N), respectively.
Qualified thin film resistors are designed with an appropriate stable R-layer and electro-isolation lacquer systems that are capable of passing the 85/85 test.
The utility function depends on parameters from the application A, the environment E and the resource R layer.
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