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Their root mean squared roughness was in a range from 2 to 6·105 μm.
The surface arithmetic average roughness (Ra) and root mean squared roughness (RMS) have been measured by an atomic force microscope (AFM: Veeco Mutimode Nano4).
Table 1 shows the surface arithmetic average roughness (Ra) and root mean squared roughness (RMS), and the length and width of maximum grains of the ferrite films on the p-Si (100) substrates.
We reported three main standard statistical parameters to describe the nanostructure of thin film surface: average roughness (Ra), root mean squared roughness (Rq) and skewness (Rsk) [25].
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The root mean square roughness was 3.1 nm.
The root mean square roughness (RMS roughness) information of all samples is listed in Table 1.
R a is the average roughness in analytical area, and R q means the root mean square roughness.
Root mean square roughness (R q): the height distribution relative to the mean line.
Root mean square roughness of 0.25 nm on SF PVA = 21 5 blend layer is lower than that of pure SF layer (root mean square roughness of 0.31 nm).
The root mean square roughness (R rms) and average roughness (R a) of prepared films are shown in Fig. 3.
Specifically, ultrasmooth (root mean squared average roughness between 1 and 3 nm), crack-free carbon films were produced.
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