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It was showed that root mean square roughness values (at 50 × 50 μm2 scanning scale) on both rough substrates reduced to ∼5 nm after coating with SDP-layer.
The root mean square roughness was 3.1 nm.
The root mean square roughness (RMS roughness) information of all samples is listed in Table 1.
Root mean square roughness (R q): the height distribution relative to the mean line.
The root mean square roughness of this surface is typically 0.24 nm.
A linear relation is observed between root mean square roughness and strain.
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The root-mean square roughness of the surface is about 7 to 10 nm, and the thickness of the films is about 1 μm.
root-mean-square roughness.
According to our results, the root-mean-square roughness (RMS) is about 0.78 nm.
A linear relation is observed between root-mean-square roughness and both strain and grain size.
Additionally, coalescence results in films of 3 µm thickness having a root-mean-square roughness of 8 to 10 nm.
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