Sentence examples for reliability limit from inspiring English sources

And in the islanded mode, the reliability limit is according to operational constraints.

This HESS has the lowest equivalent annual cost but has the best performance in load shifting and is also able to satisfy the reliability limit.

The observed 4.1% parasite prevalence in individuals over 5 years old falls within range of prior epidemiologic studies in southwestern Uganda 61 and above the lower measurement reliability limit of malariometric surveys.

The reliability limit set by TransCount for the respective sample sizes was therefore not potentially influenced by unbalanced, aRNA target preparation, as large portions of the unreliable genes were sufficiently above background levels indicating that the threshold is in fact determined during the initial phase of the amplification procedure when mRNA templates are copied into cDNA.

These reliability results compare favorably with a 1% relative error generated from a complex automated calibration system (Gore et al. 1997), and is below the TEM reliability limit of 3% as recommended by the Australian Sports Commission (Gore 2000) for these variables.

In the future, the data, assumptions, and analysis tools on which today's operational decisions rely will no longer be fast or accurate enough to reliably manage a system operated closer to the reliability limits.

This research proposes an efficient methodology that can transform a reliability limit-state constraint into a deterministic limit-state constraint.

The device reliability limits are tested on both manufacturing and electrical stress failure mechanisms.

Using lognormal-based statistical methods, the endurance stress at prescribed reliability limits and a confidence level (50%) is determined for the 107 cycle life.

Continuous scaling, necessary for enhanced performance and cost reduction, has pushed existing CMOS materials much closer to their intrinsic reliability limits, forcing reliability engineers to get a better understanding of circuit failure.

The investigation of the BE layers alone will be completed with the analyses of its integration within a TANOS (TaN/Alumina/Nitride/Oxide/Silicon) stack, pointing out the correlation between electrical performance and reliability limits.