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The intense Bragg reflections originated from nonpolar crystallographic planes and revealed the cross-linked feature of the hexagonal ZnO nanostructures.
These Bragg reflections originated from the (111), (310), and (211) crystallographic planes of the orthorhombic Sn2S3 (JCPDS no. 14-0619).
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No other apparent reflections originating from impurity phases were detected.
The flower-like CdS crystals also exhibited Bragg reflections originating from the hexagonal phase of CdS.
XRD patterns reveal only the pure (000 l -oriented refl -orientediginating freflectionsagoriginatinghase and no trace ofromy impuritheor additional phexagonal
The XRD patterns show several sharp and intense Bragg reflections originating from the ZFO structure (according to JCPDS No. 89 1012), confirming that the ZFO thin films exhibited excellent crystalline quality.
It is likely that these reflections originate from dynamic scattering events.
Please note that reflections originating from crystals exhibiting different contact planes are expected to appear in the same pole figure, if the scanned net planes have equal lattice spacing.
The back-reflections mainly originated from Fresnel reflections on the 1030 nm fiber facet and caused instabilities despite the use of a 22 dB optical isolator and an 8 degree angled fiber facet.
The additional intensity of the l = 3 n reflections originates from disordered regions, as will be discussed below.
In addition, the abrupt drop in reflection is originated from band-edge absorption of the specimen [27].
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