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The specular and diffuse reflection is shown in Figure2.
A 2D sketch of the situation in reciprocal space for the (004) reflection is shown in (b).
The subtracted α GaN − α SL curve along with the φ-scan for GaN ( left(10overline{1}2reflectioneflectisn ishownwn in c.
A RSM of the In0.14Ga0.86N epi-layer with two inter layers In0.05Ga0.95N and In0.09Ga0.91N, measured around the (10 15) reflection is shown in Fig. 14.
In a nanodiffraction experiment, we measured the diffusely scattered intensities at one individual SiGe DM that also reveal similar patterns of substrate and structure reflection: In Figure 6, a RSM near the SiGe 004) reflection is shown where a honeycomb-like pattern becomes visible, which is reminiscent of the pattern at the Si 004) substrate reflection investigated in reference [4].
29 31 The research design to promote collective reflection is shown in figure 2 as the framework for network planning.
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A full reciprocal space map in the vicinity of the 111 reflections is shown in panel (b) with Q x the in-plane component of the scattering vector.
Student reflections are shown with a diamond.
The peaks originated at (111), (200), (220) reflections are shown in Fig. 2.
Seismic lines with observed intermediate-amplitude PmP reflections are shown as dashed or hatched yellow/green lines.
These peaks can be attributed to tetracalcium phosphate (TTCP) phase, Ca4(PO4)2O; the positions of the corresponding reflections are shown in the upper part of Fig. 3.
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