Sentence examples for reduction in testing from inspiring English sources

He said ministers had missed an opportunity to solve the problem by refusing to accept the recommendations of a government inquiry into 14-to-19 14-to-19 14-to-19lleducationmajor reducthat in testing.

Further, a reduction in testing (exclude water content and assay), timepoints (annually only) and condition (25 °C/60% RH) were proposed.

While optimal recording conditions may be difficult to achieve, particularly in a clinical environment, the relatively small amount of data required for classification using this method represents a significant reduction in testing time versus conventional stimulation parameters.

To assess whether LPM closures helped control the epidemic and to account for any reduction in testing, we examined the number of confirmed A(H7N9) cases and the proportion of PUE case-patients who tested positive for A(H7N9) in the week before and the 2 weeks after LPM closures in Shanghai (population 30.5 million), Nanjing (population 8.2 million), and Hangzhou (population 8.8 million).

H2-TPR/TPD experiments revealed facile and extensive CeO2 reduction in tested samples, which increased with CuO loading, indicating strong interactions between both oxide phases.

The Congressional Budget Office concluded that an array of common proposals to clamp down on malpractice litigation might reduce national premiums for malpractice policies by 10 percent and lead to a "slight reduction" in tests and procedures.

Design-for-test methodologies have enabled considerable reduction in test time and improvement in defect isolation.

Experimental result shows significant reduction in test data volume, area and transition time.

In addition, test compression, a supplemental DFT technique for scan, is growing in importance for further reduction in test data volume and test application time during manufacturing test.

In the Rapid Test format, okadaic acid, dinophysistoxin 1 (DTX1) and dinophysistoxin 2 (DTX2) were detected similarly with 50% reduction in test line color intensity at 5 nM for the solutions applied to test strips.

A simple procedure is proposed, which uses the scan test set generated for the original circuit to determine the maximum reduction in test cycles obtainable with the architecture and to select the most suitable configuration for each circuit.