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The probe resistance R and its distance x from the resonator edge determine the strength of the ohmic coupling between the probe electrons and the resonator mode.
Eventually, the possibility of decoupling the spreading resistance from the intrinsic probe resistance will be demonstrated and discussed.
Spectrophotometer, X-ray diffraction (XRD), step height measurement instrument, digital four-point probe resistance measurement and scanning electron microscopy (SEM) were used to characterize their properties.
Figure 7 Monitoring plot of the probe resistance.
In this figure, four typical cases are applied: (i) probe resistance of 10 MΩ with WPT-Pre (AC) H-gain, (ii) probe resistance of 100 MΩ with WPT-Pre (AC) H-gain, (iii) probe resistance of 10 MΩ with WPT-Pre (AC) low-gain, and (iv) probe resistance of 100 MΩ with WPT-Pre (AC) L-gain.
The sheet resistance is measured at room temperature by using 4-point presistancetestertester (FP-001).
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Four-probe resistance tests showed a sheet resistance of approximately 10 kΩ/□.
The phase, microstructure and electro-optical properties of the films were investigated by X-ray diffraction (XRD), field emission scanning electron microscopy (FESEM), four-probe resistance meter, hall effect tester and UV-visible-infrared spectrophotometer, respectively.
Four-probe resistance measurements revealed that these fibers were nonconducting.
The two-probe resistance was determined under V bias = 0.02 V.
a Schematic illustration of the test scheme with four-probe resistance measurement method.
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