SEM observations were performed on the gold coated sample in order to prevent charging effect.
Prior to examination, samples were sputter-coated with platinum to prevent charging during FESEM imaging.
Prior to the TEM analyses, the samples were carbon-coated to prevent charging under the electron beam.
To prevent charging during SEM cycling, the sample was covered by thin graphite layer transparent for electron beam.
The samples have been coated prior to analysis with a gold layer deposited by sputtering to prevent charging.
To prevent charging one might employ the technique reported by Stokes et al. [26], regarding the charge neutralization by means of the defocused SEM in spot mode.
In order to prevent charging up, a common problem with GEMs and MPGD in general, a minimum amount of dielectric material has been used in the design.
One simple method is to prevent charging and discharging frequently so as to reduce the number of switching state of the batteries [27], and we assume that the charging process is continuous without interruption.
The SEM samples were prepared by depositing about 50 mg of the AC on an aluminium stud covered with conductive adhesive carbon tapes and then coating with Rd-Pd for 1 min to prevent charging during observations.
Polished samples were coated with carbon to prevent charging in the SEM JEOL JSM-6380, and backscattered electron images (BEI) were taken to observe the dislocation microstructures in olivine (Karato 1987; Jung and Karato 2001b).
