As generally acknowledged, for a robust design and precise failure prediction of these structures reliable material property data are essential.
Moreover, precise failure parameters of actuators are not required, and the only requirements are the lower and upper bounds of failure parameters.
To minimize the list of defect candidates according to fault diagnosis, precise failure localization with the help of failure analysis tool is needed as a complement.
Moreover, the precise failure parameters of the actuators are not required, and the requirements are only the lower and upper bounds of failure parameters.
The further work may focus on expanding the test range with various load ratios, which could complete a precise failure envelope in biaxial plane stress space.
Following μSBS testing, the fractured specimen surfaces were studied under a stereomicroscope (SZ4045, Olympus Optical Co. Ltd., Tokyo, Japan) to determine the mode of failure at 40x magnification, and the precise failure mode was determined.
This study proposes a fuzzy-based reliability approach to evaluate basic events of system fault trees whose failure precise probability distributions of their lifetime to failures are not available.
Tokyo Electric Power and government nuclear safety officials also did not explain the precise sequence of failures at the plant.
For these functions to be properly executed, calcium signaling requires precise regulation, and failure of this regulation may tip the scales from a signal for life to a signal for death.
The investigation illustrates the usefulness and cost-effectiveness of the trenching technique allied with geochronological methods to obtain information on the precise limits, age, failure mechanism, kinematics (progressive vs. episodic displacement, movement rate) and chronological evolution of landslides.
Computational modelling of medical devices enables the users to obtain knowledge of their performance and precise locations of failure in a device, implement design optimization and reduce benchtop testing thus minimizing the device development time and cost (Eswaran et al. 2011; Bobel et al. 2015).
