Sentence examples for planar cross section from inspiring English sources

Exact(1)

The element developed in this study relaxes the assumption of planar cross section; thereby allowing for including the effect of warping as well as for different stretch values at different points on the element cross section.

Similar(59)

The request for designing or reconstructing objects from planar cross sections arises in various applications, ranging from CAD to GIS and Medical Imaging.

Specifically, the proposed model is based on standard Timoshenko kinematics (i.e., planar cross-section remain planar in consequence of a deformation, but can rotate with respect to the beam center-line).

Few researchers who addressed the surface effects in nano-electromechanical systems (NEMS), have exclusively focused on investigating the beam-plate configurations with planar cross-section, while no attention has been devoted to investigate these effects in NEMS fabricated from nano-wires with circular cross-section.

In the special Cosserat rod theory [29] a beam is characterized by a curve (e.g., its centerline) (mathbf {r}:[0,L]rightarrowmathbb{R}^{3}) for the position and a rotational group (boldsymbol{Lambda}: [0,L]rightarrowmathrm{SO}(3)) for the orientation of the planar cross-sections.

The chains of 1-I, 1-III, 1- 112 all possess glide symmetry, and the glide plane and mean plane of individual chain molecules form angles of 53.8° (both independent chains of 1-I), 26.4° (1- 107), and 89.6° (1-III); i.e., the O H···O=C bonded chain of 1-III has an almost planar cross-section.

Two-dimensional cross sections perpendicular to the propagation direction were imaged using the technique of planar laser induced fluorescence (PLIF) and, in some cases, compared to simultaneously acquired schlieren images.

A Co 20 at.% Ni polycrystal produced by electrodeposition has been investigated in planar and cross sections using orientation microscopy in conjunction with high-resolution scanning electron and focused ion beam microscopy.

Microsoft DirectX and GDI+ implement graphics display of spatial BIW frame and planar thin-walled cross section.

The morphology of the coatings, particularly of the defects, was examined in planar and cross-section views by means of scanning electron microscopy before and after the test.

For this purpose, planar and cross-section preparation were applied including mechanical grinding, polishing and argon ion-beam etching followed by deposition of a thin carbon film on both sides.

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