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This SCXM (Solar Coronal X-ray Mapper) is designed to compose of a single pixel silicon PIN detector equipped with a single reflection double frustum X-ray optics.
It employs Si charged particle detectors for alpha and proton modes and a specially designed silicon PIN detector for its X-ray mode that does not require cooling for its operation.
The upstream data received at the CS is detected using the PIN detector and demodulated.
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In 2010, the University of Stuttgart prepared GeSn films with 0.5 3% Sn content using low growth temperatures and pin detectors with 1.2 1.6-μm 1.2 1.6-μmwavelength [7–10].
In 2011, academician Wang Qiming of the Chinese Academy of Sciences prepared the GeSn alloy with 1.0 3.5% Sn content and then successfully prepared pin detectors with working wavelength in the 1.3 1.6-μm 1.3 1.6-μm13].
The X-ray spectra of the samples are collected by thermoelectrically cooled Si-PIN detector.
The detection efficiency of the SCDs are determined relative to a reference Si-PIN detector.
The Si-PIN detector itself has been calibrated at the beamlines of the synchrotron facility at PTB/BESSY II.
In this paper a practical solution to perform spectral analysis of diagnostic X-ray beams is described, based on a miniaturized Compton selection chamber (CSC) using a Si-PIN detector.
Fig. 1 Real image of the detector (a) and structure (b) of Si-PIN detector based on nanostructured black silicon.
It is composed of a Mo X-Ray tube with a Be window, a X-123 Si-PIN detector from Amptek and a collimator of 1.5-mm diameter.
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CEO of Professional Science Editing for Scientists @ prosciediting.com