As the copper salt concentration increases, the diffraction peaks are much stronger and sharper, while the Cu NP size increases from 26.6 to 52.2 nm by using the Scherrer equation based on the strongest peak of the patterns, which is in well agreement with the TEM results.
The peaks of the pattern were also compared with standard patterns given by analysis centre (GPCDS files).
The results indicate that all the peaks of the pattern of the MIPs and SWCNT-MIP composites could belong to the orthogonal perovskite structure of LaFeO3.
In this figure, the peaks of the pattern showed the strong reflections of the interplanes of cubic ZnO and weak reflections of hexagonal CNT lattice structures.
Significant changes were seen in group 2 after four hours concerning the amplitude for the 1°18' and 17.7' pattern (p = 0.028 and 0.08) and the peak time of the 35.4' pattern (p = 0.038).
To further determine the crystal structure and possible phase changes after Sn doping, we collected the XRD spectra from pristine TiO2 NRs and Sn/TiO2 NRs synthesized with different precursor molar ratio, as shown in Figure 4, in which the typical diffraction peaks of the patterns have been marked.
The broad peak of the XRD pattern indicates the nanocrystalline behavior of the particles.
The main reflection peak of the XRD pattern at 2θ = 43° can be attributed to (200) plane.
In general, the reduced model captures the peak of the activity pattern, but it does not capture changes in the subset of active cells within each unit.
By applying the Scherrer equation to the most intense peak of the XRD pattern, the mean crystallite size is estimated to be about 8 nm, which is consistent with that determined by statistical analysis of the TEM images.
Moreover, the results demonstrated that the MOMD structure was changed upon insertion of MB and RY with an obvious decrease in the intensity of the second main peak of the MOMD X-ray pattern.
