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Six DGGE patterns were obtained for rrl gene.
The patterns were obtained by conducting measurement of the antennas in an anechoic chamber.
XRD patterns were obtained with a computer-controlled PANalytical X'Pert Explorer diffractometer (Almelo, The Netherlands).
Transmission electron microscopy (TEM) patterns were obtained with JEOL JEM-2100, operating at 200 kV.
X-ray diffraction patterns were obtained using a Bruker D8 Advance with Cu-Kα radiation.
X-ray diffraction (XRD) patterns were obtained using a Rigaku D/max-gB diffractometer.
X-ray diffraction patterns were obtained using CuKα radiation for Sp1 and CoKα for Sp2.
The XRD patterns were obtained in the (2θ) diffraction angle range 10 70° at 0.1° step.
High-resolution X-ray diffraction (HR-XRD) patterns were obtained to reveal the crystalline structures.
X-ray diffraction (XRD) patterns were obtained on Rigaku Dmax2000 with Cu Kα radiation.
Correct PDC patterns were obtained whose magnitude decreases as SNR decreases but whose overall shape remains.
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