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X-ray diffraction (XRD) patterns were measured by using a D8 Discover thin-film diffractometer with Cu Kα radiation (40 kV, 30 mA, λ = 1.54056 Å) and a Ni filter plus a graphite monochromator.
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The global spatial pattern was measured by using Moran's I, an index of spatial autocorrelation coefficient, yielding only 1 summary statistic for the whole study area.
Differentiation patterns were measured by flow cytometry.
The XRD patterns were measured by a D8 ADVANCE X-ray diffractometer.
Waist circumference was measured by using a nonstretchable measuring tape.
The target strength pattern is measured by combining the rotation system for tilting the aspect of the sample with the echo data acquisition system using underwater ultrasonic waves.
The XRD patterns were measured using the X-ray diffractometer (D8 DISCOVER).
XRD patterns were measured using a Bruker-AXS D5005 θ-θ diffractometer.
X-ray diffraction (XRD) patterns were measured using a diffractometer DX-27000).
Gene expression patterns were measured at day 6 by flow cytometry.
The residual stress produced by various laser shock peening patterns was measured using the contour method.
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