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The XRD pattern was acquired using a D8 ADVANCE, Bruker.
The HR-XRD pattern was acquired in the range from 20° to 90° (2θ scale).
First, the EBSD pattern was acquired from the surface area of interest (Figure 2a), and the inclination of the b-axis from the surface normal was determined (Figure 2b, c).
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Secondly, an important question is how the pattern is acquired in a non-analytical approach.
At each step, 2D slices of the diffraction pattern are acquired by the X-ray detector and subsequently collated to form a complete 3D diffraction pattern for reconstruction.
While the 8 B-scan pattern is acquired in only hundreds of milliseconds, the linear distance between adjacent 6 mm B-scans is up to 10% of the corneal diameter (1.17 mm) at the periphery of the scan.
Powder X-ray diffraction (XRD) patterns were acquired on an X'Pert Philips PW3040 diffractometer using Cu Kα radiation.
The XRD patterns were acquired using a D8 Advance-Bruker diffractometer equipped with a copper anode X-ray tube.
The wide-angle X-ray diffraction (WAXRD) patterns were acquired on a Bruker AXS D5005 diffractometer (Bruker AXS GmbH, Karlsruhe, Germany).
HRTEM images (Figure 2b,d,f) and corresponding SAED patterns were acquired from the bending areas, which present explicit illustrations of the microstructures in these kink areas.
XRD patterns were acquired on a PANalytical PW3719 diffractometer, using Cu K α radiation (λ = 1.5418 Ǻ) from a generator operating at 40 kV and 30 mA.
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