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The structure texture phase stress combined analysis was performed based on the X-ray diffraction patterns using the whole pattern fitting method.
The emission dipole axial position is also quantified in the pattern fitting method.
Figure 11A indicates the pattern fitting method locates the dipole position in the simulated data (mean axial distances of −47 and −46 nm for ⊥ and 7 polarized photoactivated probes) but did not do so for every pattern.
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The XRD pattern of TiO2 NP sample prepared at 170°C was analyzed with Rietveld profile fitting method using FullProf program [13] within anatase I41/amd space group.
We performed whole powder pattern fitting by the Rietveld method of the as-prepared Ag-HAp structures.
List all Sherpa iterative fitting methods.
This pattern fits our results.
Learn how sewing patterns fit together.
Good pattern fit has been achieved by the Rietveld method using MAUD (material analysis using diffraction) [ 38].
As a result, if η is obtained at an observation point, a reasonable density profile can be chosen from the interference pattern with this phase-map-fit method.
The curve-fit method correctly identified damage 92·6% of the time compared to 76·1% for the pattern classifier.
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