Although a number of influencing factors have been identified, the origins of relaxation behaviour are poorly understood.
In every case, strain-induced crystallization was found to be the major origin of stress relaxation.
The origin of plastic relaxation is probably the inclusion of a dislocation network.
As for the very origin of the relaxation time constant of the double layer capacitance, more detailed experiments are necessary.
In this article, we rigorously discuss the potential origin of the relaxation phenomena of IPMCs that can be related to electro-chemically induced surface reactions with electrodes.
Our results show that although the origin of the relaxation peak is not related with dislocations, dislocations can affect the twin boundary hydrogen interaction process in two opposite ways.
To better understand the origin of these relaxation processes, it will be necessary to conduct combined analyses of magnetometry using both pulsed-field and static field, as well as various characterization methods in time domain (e.g., Weaver and Kuehlert 2012; Kolhatkar et al. 2013) and frequency domain (e.g., Astalan et al. 2007; Kodama 2013).
A detailed explanation of the molecular origin of the relaxations is provided.
Molecular mechanic calculations have been carried out in order to elucidate the characteristics and molecular origin of the relaxations observed in this zone.
There is, however, disagreement on the size or even the nature of the clusters and fraction of interstitial space in amorphous solids, the origin of enthalpy for relaxation, the contribution of molecular geometry to the structure of amorphous solids and its relationship to relaxation, and finally the structural connection between the relaxation process and crystallization.
