Sentence examples for on process yield from inspiring English sources
International Journal of Advanced Manufacturing Technology 25(533 541]3–541] proposed a capability index for multiple characteristics called CTPU, which provides an exact measure on process yield for multiple characteristics with each characteristic normally distributed.
A measurement index, called Spk, has been proposed to calculate the yield for normal processes, and can be used to establish the relationship between the manufacturing specifications and the actual process performance, which provides an exact measure on process yield.
In particular, critical dimension microscopy provides information about design template matching and edge placement errors through links with design having proven beneficial effects on process yield and product reliability.
The impact of stimulus on process yield was not significant.
The results of 120 experimental runs using SmP E were further summarized in Figure 2. Effects of polymer dose and operating pH on process yield were clearly demonstrated in Figure 2A(1–3).
The difference in xylose yield of the INL corn stover compared to that of the Kramer lots highlights the effect that feedstock variability can have on process yields.
It was also desired to determine which process variables, such as solids washing and fraction of solids recycled, had significant effects on process yields, and how the manipulation of these variables would impact the hydrolysis reaction conditions.
A 33 Box Behnken design and Response Surface Methodology were performed to evaluate the influence of extract feed rate, drying air inlet temperature and spray nozzle airflow rate on the process yield, stability parameters (moisture content and water activity) and on several physicomechanical properties of spray-dried rosemary extracts.
In particular, the effect of the quantity of water, air-flow rate and plate rotational speed on the process yield and physical-technological characteristics of pellets was studied.
Downstream equipment by itself does not contribute to the actual purification event, but wrongly designed/chosen equipment can have a deterioration effect on the process yield and economy.
Pearn et al. (1992) proposed the process capability index C pkm that have a same link between C p and C pk with C pm. Boyles (1994) proposed S pk index based on the process yield of the process.
