Sentence examples for on an atomic force from inspiring English sources
Atomic force microscope (AFM) and Kelvin probe force microscopy (KPFM) measurements were performed on an atomic force microscope (Asylum Research MFP-3D, USA) [17].
Staphylococcus epidermidis were immobilized on an atomic force microscope (AFM) tip and used as a force probe to detect the interaction forces between bacteria and gold-coated SAMs.
The measurements of surface potentials and polarization angles were performed using an atomic force microscopy (AFM) and Kelvin probe force microscopy (KPFM) on an atomic force microscope (Asylum Research MFP-3D) [13].
We report on an atomic force microscopy (AFM) study of the morphology evolution of Au film deposited on mica by room-temperature sputtering as a function of subsequent annealing processes.
Here, to investigate potential-induced degradation (PID) of solar cell modules, we have developed an in-situ stressing capability with applied high voltage (HV) and high temperature (HT) on an atomic force microscopy (AFM) platform.
The step velocity of the tetragonal hen egg-white lysozyme (1 1 0) crystal plane toward the [0 0 1] direction could be controlled and measured accurately on a nanometer scale using a specially designed sealed sample vessel on an atomic force microscope.
Nanoporous templates have been developed and fabricated employing technology based on heavy ion bombardment and track etching of polymer films or polymer layers deposited on substrates; an alternative and unique tool based on the adaptation of an atomic force microscopy has been also developed to elaborate nanotemplates with pores of ultra-small dimensions down to a few nanometers.
This paper attempts to determine the effect of the capillary force exerted on the cantilever probe tip of an atomic force microscope.
While the incident angle, ion flux (J), and ion fluence were changed and the InP crystal was rotated, cone-like, ripple, anisotropic nanostructures were observed on the surface by an atomic force microscope.
A multi-modal analysis on the intermittent contact between an atomic force microscope (AFM) with a soft sample is presented.
This structure accommodates a nanomechanical interfacial characterization method where a transverse force applied on the suspended CNT using an atomic force microscope results in an axial pullout force, which is obtained by the force-distance curves and a force balance relation.
