We assume that the responses to different test items, applied to the same part, do not affect one another and the same scale invariant item response model applies to all members of the tested population of objects under test (OUTs).
In applications such industrial process tomography and non-destructive testing (NDT), the objects under test may exhibit variations in both dielectric permittivity and electrical conductivity.
In this article, the general problem is formulated from the metrological point of view for a high variety of objects under test and a homogeneous item response function.
Three MEMS accelerometers are purposely located with specific orientations and the system output is determined from the accelerometer that is most sensitive in the tilting range of the object under testing.
Detailed data analysis indicates that higher-order form deviation of the object under test might be one of the key error sources within the calibration setup.
An experimental prototype was developed which involves bouncing or hopping of the plunger based impact probe freely on the plain surface of an object under test.
A reference image was acquired with the phantom placed longitudinally in the magnets isocenter without the object under test (OUT).
In image analysis, by extracting the features (statistical features, shape features, geometric features, texture features, etc). of the object under test, the process of decision-making is obtained by using the default criterion.
Basically, each object under test (OUT in the following) was mounted on a rotating plate upon a solid positioner platform scanning all azimuthal angles with 5° step of resolution.
In general, we need to project two sets of fringes: the first one set consists of a sequence of sinusoidal fringe patterns used to determine the profile of the object under test, and the second is a sequence of stair phase-coding fringes used for determining the fringe orders.
Digital signal processing including background and noise removal is performed offline to reconstruct the image of the object under test.
