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The simplified model of the SiO2 negative replicas was built as shown in Fig. 5a.
d The EDS spectrum showed the main elements constituting the SiO2 negative replicas.
From arrays of 1 μm high and 200 nm wide pillars produced with e-beam lithography and reactive ion etching negative replicas were first formed by polydimethylsiloxane (PDMS) casting.
b The average reflection of the SiO2 negative replicas was about 20%% which was just 1/4 of the reflection of the flat plate without the negative quasi-honeycomb-like structure.
And the element enrichment regions of both silicon and oxygenium were consistent with the shape of the SiO2 negative replicas as the area scanning maps shown in Fig. 4e, f, which further indicated that highly purified SiO2 replicas were obtained.
Fig. 5 Schematic illustration of the multiple reflection and refraction occurred in the SiO2 negative replicas and the reflectance spectroscopy analysis of the SiO2 negative replica. a After multiple reflections and refractions, incident light traveled for a longer distance, and only a small part of the solar energy was reflected back to the air.
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b Medium magnification image of the SiO2 negative replica.
At last, the reflectance spectroscopy of the SiO2 negative replica and a flat plate was measured.
Fig. 4 FESEM images and EDS spectrum of the SiO2 negative replica. a Lower magnification image.
Figure 4c is a high-magnification image of the negative replica of the black wing scales.
However, the size of the negative replica was a bit different from the original scales.
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Justyna Jupowicz-Kozak
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