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The surface morphology of thin films was studied by scanning electron microscopy measurement.
Surface morphology of thin films was analyzed by atomic force microscopy (AFM).
AFM images reveal that the morphology of thin films depended on the deposition temperature.
The surface morphology of thin films is one of the important factors that can influence the thin films applications.
Structure and morphology of thin films have been studied by atomic force microscopy (AFM) and X-ray diffraction (XRD).
The structure and the morphology of thin films were investigated by X-ray photoelectron spectroscopy and atomic force microscopy.
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Crystal structures and surface morphologies of thin films were investigated by X-ray diffraction (XRD) and field emission scanning electron microscopy (FESEM).
The surface and cross sectional morphologies of thin films were examined by scanning electron microscopy (SEM) and transmission electron microscopy (TEM).
The surface and cross-sectional morphologies of thin films were examined by scanning electron microscopy (SEM) and transmission electron microscopy (TEM), respectively.
Morphologies of thin films crystallized at 120 °C from melt were dominated by the flat-on lamellae, while the ones crystallized at 70 °C from melt were dominated by the edge-on lamellae.
The morphology of the thin layer is observed under microscopy and SEM, revealing that the thin surface layer was composed of many thinner layers.
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