Sentence examples for morphology and element from inspiring English sources

The morphology and element distribution were analyzed by scanning electron microscopy and energy dispersive spectroscopy, respectively.

Optical microscope and scanning electron microscopy coupled with energy-dispersive spectrometry were used to characterize the morphology and element distribution of the composites.

(a) FESEM image of 2D graphene graphene composite, (b) the EDS mapping of element C, (c) combination of morphology and element C distribution, (d) and (e) EDS mappings of elements Ga and O, respectively, and (f) EDS element analysis.

The morphology and element distribution of the as-prepared samples were characterized by field emission scanning electron microscopy and high-resolution transmission electron microscopy.

The effect of annealing temperature on phase composition, morphology and element diffusion was investigated using X-ray diffraction (XRD), scanning electron microscope (SEM), energy dispersive spectroscopy (EDS).

The crystal structure, morphology and element distribution of ZnO QDs, MoS2 and MoS2@ZnO QDs were characterized by X-ray diffraction, scanning electron microscopy, transmission electron microscopy and energy dispersive X-ray spectrometry, respectively.

Chromium films formed by PIIIeD were studied with respect to corrosion resistance, surface morphology and elements profile.

The variation in the quantities of deposits obtained with the surface temperature presents a two-peak shape, and the main components of the deposits in the two peaks differed completely in terms of morphology and elements.

The morphologies and element compositions of the samples were measured by scanning electron microscope (SEM EDS) (S4800, Japan).

The surfaces morphologies, cross sections morphologies, and element maps of the surface were analyzed by Scanning electron microscopy (SEM) and energy dispersive spectrum (EDS).

After plating, surface morphologies and element analysis of the Si nanowires with metal tube were characterized by a SEM (JSM 7001F, JEOL) equipped with energy dispersive X-ray analysis system (EDXA, Inca Energy-350, Oxford Instruments, UK).