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The surface morphologies and roughnesses were characterized by ex situ AFM and SEM.
Surface morphologies and roughnesses of the coatings have been investigated down to nano-scale to probe the relative surface characteristics.
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Surface morphologies and roughness of CrN films on the nanoscale were explored.
By inserting Cs2CO3/PCBM bilayer, the morphologies and roughness of WO3 were modified for better deposition of highly dense and pinhole-free perovskite layers.
In order to comprehend morphologies and roughness change for the deposition of Cs2CO3/PCBM bilayer on WO3 NL, the AFM images and R a values of the bare FTO, FTO/WO3 NL, and FTO/WO3 NL/Cs2CO3/PCBM were investigated and shown in Fig. 6.
Magnetron sputtering is a promising coating technique and has been widely used to fabricate thin metal nanostructured films with varying morphologies and roughness [ 19].
The resulting coatings possessed different thickness, crystallinity, morphology and roughness.
The surface morphology and roughness of the structure were observed by atomic force microscopy (AFM).
Further, atomic force microscopy was employed to examine PEEK surface morphology and roughness.
The surface morphology and roughness of films were studied by atomic force microscopy (AFM).
Atomic force microscopy was used to analyze the surface morphology and roughness of the prepared membranes.
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