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The vertical deflection was monitored at midspan using an LVDT sensor.
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was monitored at 265 nm.
The sample was monitored at 257 nm.
The fractions were monitored at 210 nm.
NADH oxidation was monitored at 340 nm.
Fluorescent emission was monitored at 510 nm.
Effluent was monitored at 205 nm.
Heme was monitored at 405 nm.
Analytes were monitored at 254 nm.
Bacterial growth was monitored at OD600 nm.
In addition, PIV technique was used to monitor the cross-sectional flexural strain distributions at midspan.
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