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Modification of atomic structure, degree of eutectic structure refinement and volume fraction of the constituent phases with the addition of In and Nb are the crucial factors in enhancing the mechanical properties of Ti Fe–(In, Nb) composites.
To avoid the expected ion beam-induced modification of atomic composition in the investigated volume, the sample surfaces were analyzed without sputter cleaning.
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Various physical properties of the confined hydrogen atom, such as the modification of their atomic orbitals, energy levels, the filling of electronic shells, and linear and nonlinear polarizability, have been studied [8].
A local hardening is most efficiently obtained by a modification of the stacking sequence of atomic layers, resulting in the formation of twins or martensite.
Quantitative electron microscopy has been carried out to study structural modification of the alloy in atomic level caused by O charging.
Such modification (that is often used in fitting of atomic structures into EM maps) requires knowledge of the target resolution, the experimental determination of which is susceptible to inaccuracies, especially in low resolution studies [38].
This reversible process uses only atomic tip surface interactions and allows the precision modification of the metal surface at the atomic scale.
The present review includes: (i) a brief introduction to atomic and structural modification of nanotubes; (ii) a review of mechanical analysis of atomically and structurally modified models in two separate sections; and (iii) a detailed conclusion on the discussed studies and present the potential progress.
Analytical models to describe the energy landscapes are developed using energy scaling relations for van der Waals surfaces in combination with a modification of the Prandtl Tomlinson model for atomic friction.
To further characterize the formation of interface modification, atomic force microscopy imaging is performed.
The changes in surface morphology and roughness of samples were examined 17 days after modification by atomic force microscopy (AFM) using a Veeco CP II device (Bruker Corporation CP-II, Santa Barbara, CA, USA) ('tapping' mode, probe RTESPA-CP, spring constant 20 to 80 N∙m−1).
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