Sentence examples for mode using standard from inspiring English sources
Atomic force microscopy measurements shown in Figure 1a-d to illustrate the numerical models connection to real data in this article were performed using AFM Explorer (Thermomicroscopes) in contact and non-contact mode, using standard contact (type MSCT-EXMT-A1) probes supplied by Veeco company and non-contact probes (type PPP-NCLR) supplied by NanoAndMore company.
Samples were analysed in positive mode using standard ESI+ acquisition parameters whilst checking the total ion count (typically between 10 10).
The AFM apparatus (Dimension 3100) was operated in light tapping mode, using standard tapping probes (RTSEP Silicon AFM tips, Veeco: resonant frequency 200 400 Hz, spring constant 20 40 N m−1) under ambient conditions (dry samples).
The sample was mounted onto a Multimode AFM with a NanoScope V system operating in Tapping Mode using standard phosphorus-doped silicon probes (T: 3.5 4.5 lm, L: 115 135 lm, W: 30 40 lm, K: 20 80 N/m) (Veeco Instruments, Plainview, NY, USA).
The intensity and localization of HIF-1α staining was analysed by confocal microscopy (Olympus): DIC, DAPI and Alexa-555 images were collected with a ×60 oil immersion objective in eight planes using a 0.5 μm step in sequential mode using standard excitation and emission wavelengths.
Based on the design method, we propose an orientation-insensitive two-mode fiber coupler at 850 nm working as a mode multiplexer/demultiplexer for two-mode transmission using standard single-mode fiber.
This paper presents a gm/ID based design methodology for low voltage current mode circuits using standard CMOS technology.
Experiments were performed with MFP-3D-BIO (Asylum Research; Santa Barbara, CA) operating in tapping mode (AC) using standard silicon cantilever (AC240TS) with ~2 N/m spring constant and 70 KHz working frequency.
Images were taken in tapping mode using a standard silicon cantilever (TESPA, Bruker Corp).
It was of special interest in the present study to characterize the ability to image in SE mode at high temperatures, where light emitted from the heating device would typically (in conventional SE mode using a standard heater in a SEM [1, 2]) cause the SE detector to be adversely affected and make high resolution imaging impossible.
The platform was operated in the nano-LC mode using the standard nano-ESI API source fitted with a PicoTip emitter that had an uncoated fitting and 10-µm spray orifice (New Objective, Inc., Woburn, MA).
