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Figure 3 Normalized FTIR spectra measured in ATR mode for samples deposited with different r H.

The etching was performed in galvanostatic mode for samples #1 to #6 and in potentiostatic mode for sample #7.

The crystallization vessels of the original CRYSTAF part of the apparatus are used in the TREF mode for sample dissolution and filtration of up to five different samples.

Once dried, the nanoparticle spots were visible in optical, MS, and electron microscope images and could therefore be used to register spatial locations across these distinct imaging modes (the CRM microscope was operated in bright field mode for sample navigation and visualization of microspots).

The XRF device was operated in "paint" mode for surface samples (lower detection limit, 0.1  μg/cm) and "soil" mode for soil samples (lower detection limit, 1 mg/kg), with measurements over a 30-second period.

The results show different fracture modes for the thinner and the thicker coating samples; the multiple transverse cracks, vertical to the interface between the coatings and the substrates, in the coatings are the main fracture mode for the samples with coatings thinner than about 200 μm, while the interface crack is the main fracture mode for the samples with coatings thicker than about 300 μm.

From the visual inspection, for the impacted side of the samples, it is noted that the main damage modes for repaired samples are matrix and fiber cracks around point of impact and delaminations while severe matrix cracks expanded through fiber directions are the dominant damage mode for unrepaired samples.

For this purpose, we first applied SICM to image collagen fibrils and showed the usefulness of the approach-retract scanning (ARS)/hopping mode for such samples with steep slopes.

Screening of all compounds was performed in target MS/MS mode for all samples using the window tolerance of 5 ppm.

Near-field optical signal profiles measured in contact mode for composite sample (thick lines) and virgin glass sample (thin lines) both subjected to the EFI process.

10000 events were gated and acquired in list mode for every sample.