Sentence examples for milling specimens are from inspiring English sources
The results suggest that the diffraction peaks of milling specimens are corresponded well with that of raw CL-20.
Cross-section TEM specimens are prepared by mechanical polishing, dimpling, and final ion milling in a Gatan Precision Ion Polishing System.
The cross-sectional specimens are prepared with conventional processes: cutting, gluing, polishing, and ion milling (PIPS 691, GATAN) operated at 5 keV.
Milling of the specimens was performed using a Quanta 200 3dualal beam SEM-FIB.
To confirm such a notion, the S-N fatigue curves of β-annealed and mill-annealed Ti64 specimens were normalized by the yield strength values.
From each milled sample, three specimens were extracted for NMR, μCT, and mechanical testing (Fig. 4).
During the milling, the specimen was also imaged using the SEM at 3 5 kV and 5 30 pA.
Specimens were milled to electron transparency with 40 keV Ga+ ions and then finally polished with 5 keV Ga+. Figure 3a,b shows the TEM images obtained from the tip and body part of the ZnO/CdO core/shell structure.
After the postpolymerization treatments, all specimens were milled into small pieces in order to prepare three samples of each specimen.
Contact surfaces of the lower specimens were prepared by milling with different initial surface roughness while the upper specimens were polished.
The specimens were then ion milled to electron transparency at room temperature using 4 kV argon ions incident at 5°.
