Besides, the microstructure and element composition of the bonding interface are almost unchanged before and after aging.
The microstructure and element distribution of cermet were analyzed by using Scanning Electron Microscopy (SEM) equipped with Energy Dispersive X-ray spectroscopy (EDX).
The morphology, microstructure, and element composition of Ni/MPC are characterized by scanning electron microscopy, nitrogen adsorption and desorption, and X-ray photoelectron spectroscopy, respectively.
The optical properties, microstructure and element distribution in depth were investigated by spectroscopic ellipsometry, UV-vis-NIR spectrophotometer, transmission electron microscope (TEM) and Auger electron spectroscopy (AES), respectively.
The microstructure and element composition of the films was analyzed using a scanning electron microscope coupled with a energy-dispersive spectrophotometer (JEOL 2300 model, Tokyo, Japan) and TEM CMM 200 Philips, Amsterdam, Netherlands (200 kV HT)).
X-ray diffraction, scanning electron microscopy and energy dispersive X-ray spectroscopy were used to analyze the phase, microstructure and element distribution of the as-prepared coating.
The phase composition, microstructure and element distribution of the coating were analyzed using X-ray diffraction, scanning electron microscopy and energy dispersive X-ray spectroscopy.
In this study, the Zr Si N films are prepared by magnetron sputtering and the effects of Si contents on the composition, microstructure and element chemical state of the films are analyzed by X-ray diffractomer (XRD), energy disperse spectroscopy (EDS) and X-ray photoelectron spectroscopy (XPS) analysis.
The alloy microstructures and elements segregation were analyzed.
These unique microstructures and elements distribution patterns caused the better electrochemical performance of NAB coating fabricated by WULC.
