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A silicon wafer substrate for atomic force microscopy was obtained from Silicon Valley Microelectronics, Inc. (Santa Clara, CA, USA).
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In contrast, perforated PLA FsNMs with pores crossing the entire film thickness, which have been characterized by scanning electron microscopy and atomic force microscopy, were obtained using PLA PVA mixtures.
Stable latexes composed of spherical polymer particles with sizes ranging between 300 and 700 nm as characterized by dynamic light scattering and scanning electron microscopy were obtained.
Images of interference reflection microscopy were obtained by a combination of EYFP excitation and ECFP emission filters.
Fluorochrome-conjugated secondary antibodies for immunofluorescent confocal microscopy were obtained from Life Technologies and Abcam.
All reagents used for light microscopy were obtained from Sigma-Aldrich, otherwise indicated.
All reagents and materials used for electron microscopy were obtained from Sigma-Aldrich.
Specimens for electron microscopy were obtained from 12 site and age-matched physes, 6 non-affected cn/+and 6 affected cn/cn.
All human brain samples for light microscopy were obtained from the brain bank at the Institute for Clinical Neuroanatomy, University of Frankfurt (Table 1).
High-resolution transmission electron microscopy (TEM) was obtained using a Tecnai G2 F30 S-Twin model (FEI, Hillsboro, OR, USA) at 300 kV.
Scanning electron microscopy (SEM) imaging was obtained using JSM-6500 F (JEOL, Tokyo, Japan).
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