Sentence examples for microscopy such as from inspiring English sources

There are several types of super-resolution (or super-resolved) microscopy, such as photoactivated localization microscopy (PALM), stimulated emission depletion (STED) microscopy and stochastic optical reconstruction microscopy (STORM) (reviewed in Ref. 111).

Intravital microscopy such as in vivo imaging of brain dynamics is often performed with custom-built microscope setups controlled by custom-written software to meet specific requirements.

Turn-on mode fluorescence switching molecules are applicable to super-resolution fluorescence microscopy, such as PALM (photoactivation localization microscopy), STORM (stochastic optical reconstruction microscopy) or RESOLFT (reversible saturable (switchable) optical linear fluorescence transitions) microscopy.

This can include techniques common to several types of microscopy such as frame averaging to improve signal-to-noise ratios (SNR) or time series to study dynamic processes or more specific applications.

The characterization was achieved by combining a sequential measurement of electron microscopy such as transmission electron microscopy (TEM), field-emission scanning electron microscopy (FE-SEM), and electron spectroscopy for chemical analysis (ESCA).

Furthermore, there are other limitations in fluorescence microscopy, such as phototoxicity and imaging setup complexity.

Scanning probe microscopies, such as scanning tunnelling microscopy (STM) and atomic force microscopy (AFM), were initially developed for imaging surfaces23.

DFT calculations of the molecular orbitals and density-of-states of the tip show that this tip structure apart from being stable can be used in scanning probe microscopies such as STM for very high resolution imaging.

Whilst not discussed here explicitly, the methods developed are also applicable to other scanned microscopies such as atomic force microscopy.

The methods demonstrated for registering STEM data are equally applicable to other scanned probe microscopies such as atomic force microscopy (AFM) or scanning tunnelling microscopy (STM) where careful image reregistration is equally important.

Studying such atomic instabilities using electron microscopies (such as EELS) is problematic for diameters >5 nm (see Supporting Information), and tends to be invasive as well as only operating in vacuum, precluding in situ photochemistry.