We report a pattern recognition approach to detect the atomic structure in high-resolution transmission electron microscopy images of graphene.
(a) Scanning force microscopy of the graphene quantum dot device.
We report here in situ transmission electron microscopy of crumpled graphene sliding, demonstrating that it possesses intra-sheet links and graphitic nanocrystals that provide additional mechanical stability and enable the material to reversibly deform.
Topographical atomic force microscopy (AFM) analysis of graphene mesh has indicated very abrupt edges, and structural analysis by transmission electron microscopy (TEM) and Raman spectroscopy have confirmed clean and empty holes within graphene of high structural quality (Fig. 2a c).
Scanning electron microscopy (SEM) images of graphene oxide platelets exfoliated from various graphite sources with D/h aspect ratio of 1600, 1200, and 700, respectively [7].
c, d The optical microscopy and scanning electron microscopy of the multilayer graphene domains transferred to SiO2, respectively.
Here we report a straightforward technique to optically observe GBs in CVD-grown graphene via optical microscopy, allowing rapid assessment of graphene quality as well as the number of layers.
Transmission electronic microscopy verified the better dispersion of graphene sheet in star polymer matrix than linear polymer matrix.
Atomic force microscopy imaging of irradiated part of graphene is shown at fluences (a) 1 × 1013, (c) 3 × 1013 and (e) 1 × 1014 ions/cm2, and corresponding section analyses is shown in (b), (d) and (f), respectively.
We have used scanning tunneling microscopy to study the growth of graphene on a periodically stepped Ir(3 3 2) substrate surface, which is a promising route for modification of graphene properties.
