Direct techniques include transmission electron microscopy (TEM), scanning electron microscopy (SEM), and atomic force microscopy (AFM).
Specimens are observed by either transmission electron microscopy or scanning electron microscopy.
The alloying behavior, phase evolutions, microstructures and properties of samples were investigated by X-ray diffraction, differential scanning calorimetry, field emission scanning electron microscopy, microscopy/Vickers hardness testing and electrochemical polarization measurement.
Destructive methods include tapper polishing, SEM microscopy, TEM microscopy, cross-sectional microscopy and chemical etching.
We have extensive facilities in microscopy and cryo-electron microscopy.
In particular scanning electron microscopy, transmission electron microscopy, atomic force microscopy, scanning tunneling microscopy, tomography, scanning transmission X-ray microscopy and laser scanning confocal microscopy are addressed.
The specimens were characterised using microscopy (light microscopy, scanning electron microscopy and topography analysis) and scratch testing on a nanoindenter.
Steady state spectroscopy, atomic force microscopy, electron microscopy and dynamic light scattering methods were used.
Changes in the surface morphology were analyzed by optical microscopy, confocal microscopy, and AFM.
Evidence of the CNS formation is given by optical microscopy, scanning electron microscopy, and transmission electron microscopy.
