Three experimental observation methods – optical microscopy, scanning electron microscope and transmission electron microscopy – were combined to obtain new insights into the microstructural and fractographic characteristics after TMF cycling with and without a compressive hold time.
X-ray diffraction, field emission scanning electron microscopy, transmission electron microscope, high-resolution transmission electron microscopy, electron diffraction, energy-dispersive X-ray analysis, Fourier transform infrared spectroscopy and Raman spectroscopy were used to characterize the products.
X-ray powder diffraction, field emission scanning electron microscopy, transmission electron microscope, high-resolution transmission electron microscopy, electron diffraction, X-ray photoelectron spectroscopy and Raman spectroscopy were used to characterize the products.
MHY, XY, and XXW collected and analyzed the data of the scanning electron microscopy, transmission electron microscope, and color measurement.
Structural and optical analyses acquired from X-ray diffraction, scanning electron microscopy, transmission electron microscope and photoluminescence spectroscopy were also performed.
Films were characterized from the center to the edges of substrates using scanning electron microscopy, transmission electron microscope, and Raman analysis.
The nanocomposites are characterized using laser scanning confocal microscopy, transmission electron microscope, and fluorescence spectroscopy, among others.
Field-emission scanning electron microscopy, transmission electron microscope and X-ray diffraction were used to characterize these NPs.
The morphology and properties of the nanoparticle and nanofluids are characterized by transmission electron microscopy, scanning electron microscope, energy dispersive X-ray spectroscope, X-ray diffraction spectroscopy, and dynamic light scattering, as well as effective thermal conductivities.
The identification of materials is done using widely utilised instrumentation such as microscopy, scanning electron microscope (SEM), Fourier transform infrared spectroscopy (FTIR), Raman etc.
