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The behavior of Mn when doped into ZnO by ion implantation was investigated by scanning transmission electron microscopy, electron energy loss spectroscopy and energy dispersive X-ray spectroscopy.
The materials were characterized by electron microscopy, electron energy loss spectroscopy, Mössbauer spectroscopy, infrared spectroscopy, small angle X-ray scattering, wide angle X-ray scattering and magnetic measurements.
The microstructure and electronic structure of modified carbon black (CB) were investigated by Raman spectroscopy, transmission electron microscopy, electron energy loss spectroscopy and ultraviolet spectroscopy.
The annealed microstructures are studied by independent characterisation methods, including scanning electron microscopy, electron energy loss spectroscopy and atom probe tomography.
Crystallography of the tubes and their fillings was studied using high-resolution transmission electron microscopy, electron energy loss spectroscopy and energy dispersive X-ray analysis.
The films were characterized in terms of their structure, elemental and phase composition using X-ray diffraction, scanning and transmission electron microscopy, electron energy loss spectroscopy, glow discharge optical emission spectroscopy, Raman, and IR spectroscopy.
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The resultant nanostructures were examined using transmission electron microscopy, electron energy-loss spectroscopy and X-ray photoelectron spectroscopy.
The microstructure of the film was analyzed using X-ray diffraconventionalntionandand high-resolution transmission electron microscopy, electron energy-loss spectroscopy, energy dispersive X-ray elemental mapping, selected area electron diffraction, and dynamical electron diffraction calculations.
Employing a combination of atomic resolution transmission electron microscopy, electron energy-loss spectroscopy, energy-filtered transmission electron microscopy and electron tomography, we provide evidence that significant degradation of the CNT structure takes place during the dispersion process.
X-ray diffraction, visible, and ultraviolet Raman Spectroscopy, energy-filtered transmission electron microscopy, electron energy-loss spectroscopy, and X-ray photoelectron spectroscopy (XPS) were employed to study the carbon bonding nature of the films and to analyze the carbon clustering around the seed nanoparticles leading to diamond synthesis.
The irradiated layers were analyzed by means of various complementary methods (Rutherford backscattering spectrometry, cross-sectional transmission electron microscopy, electron-energy loss spectroscopy, m-line spectroscopy).
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