Sentence examples for microscopy electron backscatter from inspiring English sources
The base metal and the ORL were quantified using microhardness indentations, optical microscopy, and scanning electron microscopy (electron backscatter diffraction (EBSD), backscattered electron (BSE), and secondary electron (SE) imaging).
The as-received powder and the deposition were characterized via scanning electron microscopy, electron backscatter diffraction, and transmission electron microscopy.
Scanning electron microscopy, electron backscatter diffraction and atom probe tomography results reveal the mechanism of austenitic transformation below Ae1.
In order to study these materials, X-ray diffraction, micro- and nano-indentation hardness, surface profilometry, optical microscopy, electron backscatter diffraction and ball-on-plate reciprocating wear testing were employed.
The precipitates formed owing to the partitioning behaviors of the alloying elements were investigated using scanning electron microscopy, electron backscatter diffraction analysis, electron probe microanalysis, and transmission electron microscopy.
Transmission electron microscopy, electron backscatter diffraction, electron channeling contrast and secondary electron imaging techniques are jointly utilized to carry out detailed microstructural characterization.
Microstructures of the NMMs were characterized using X-ray diffraction, scanning electron microscopy, electron backscattered orientation mapping, and transmission electron microscopy before and after the tests.
Hooks and other sub-surface features in continuous-cast ultralow-carbon steel samples were examined using optical microscopy, electron backscattering diffraction, energy dispersive X-ray spectroscopy, and electron probe microanalysis techniques.
The morphology, as well as the luminescencent, electrical and chemical properties, of the Mn-doped In2O3 micro- and nanostructures were characterized by means of X-ray diffraction, scanning electron microscopy, electron backscattered diffraction, cathodoluminescence (CL), energy dispersive X-ray spectroscopy, remote electron beam induced current (REBIC) and X-ray photoelectron spectroscopy (XPS).
The surface microstructure of Fe-2%Cr alloy and Fe-10%Cr alloy treated with AIH-FPP at 973 K and 1073 K was characterized using optical microscopy, scanning electron microscopy (SEM), electron backscatter diffraction (EBSD), and transmission electron microscopy (TEM).
Microstructural characterization of shot-peened material is performed through light microscopy, scanning electron microscopy and electron backscatter diffraction.
