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Raman spectra and transmission electron microscopy are used to investigate details of the modified layer.
Scanning electron microscopy (SEM), X-ray diffraction and optical microscopy are used for the material characterisation.
Scanning electron microscopy and atomic force microscopy are used to characterize the sensor electrodes.
Raman spectroscopy and atomic force microscopy are used to quantify the burnout of nanotubes.
Data collected with electron beams at various energies of interest in electron microscopy are used to determine the detector response.
X-ray diffraction and SEM microscopy are used to check the microstructure changes during the sintering temperature.
Similar(25)
Florescent microscopy was used to confirm cell attachment, and confocal microscopy was used for further investigation.
Scanning electron microscopy was used to analyze the fiber diameter.
Atomic force microscopy was used to examine the surface roughness.
Interferometric microscopy was used in assessing the surface roughness.
Transmission electron microscopy was used to observe the structures.
More suggestions(15)
scanning are used
microscopy are provided
microscopy are reviewed
microscopy are combined
microscopy are detailed
microscopy are related
microscopy are numbered
microscopy are given
microscopy are performed
microscopy are reported
microscopy are confirmed
microscopy are shown
microscopy are explained
microscopy are illustrated
microscopy are indicated
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